Experimental study on material removal rate of different material by ion beam polishing

Zhe Chen; Jie Tian; Xinnan Li; Chen Xu; Bo Li

doi:10.1117/12.3021137

26 August 2024 Experimental study on material removal rate of different material by ion beam polishing

Zhe Chen, Jie Tian, Xinnan Li, Chen Xu, Bo Li

Proceedings Volume 13100, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation VI; 1310048 (2024) https://doi.org/10.1117/12.3021137
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Conference Poster

Abstract

Ion beam polishing processing technology is a processing method developed in recent decades using high-energy ion beams, which is suitable to removal and processing different materials, because its working process has incomparable advantages compared to other processing methods. Process studies involving multiple materials in the same area have not been reported. In this paper, the influence of Ion beam polishing processing technology parameters on the removal rate of different materials in a small area is studied experimentally, and the removal rate of high-purity silica glass, doped silica glass and epoxy resin adhesive layer is tested by single factor and orthogonal test method, and the corresponding removal rate prediction formula is established through analysis. Experiments show that within a certain range of process parameters, gate voltage, gate current and gate size have obvious effects on the removal rate, while working distance and step size have the lowest impact. Prediction formulas and experiments are used to derive optimal process parameters for simultaneous removal of different materials.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zhe Chen, Jie Tian, Xinnan Li, Chen Xu, and Bo Li "Experimental study on material removal rate of different material by ion beam polishing", Proc. SPIE 13100, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation VI, 1310048 (26 August 2024); https://doi.org/10.1117/12.3021137

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