Uncertainty estimation in optics and optoelectronic systems

Patrice Salzenstein

doi:10.1117/12.3036094

20 November 2024 Uncertainty estimation in optics and optoelectronic systems

Patrice Salzenstein

Proceedings Volume 13241, Optical Metrology and Inspection for Industrial Applications XI; 132410I (2024) https://doi.org/10.1117/12.3036094
Event: SPIE/COS Photonics Asia, 2024, Nantong, Jiangsu, China

Abstract

In this work, we present the general method to estimate the measurement uncertainty related to opto-electronic and photonic systems. It consists in a modern method, which follows the recommendations of the Guide to the Expression of Uncertainty in Measurement. After determining the uncertainty propagation equation, we review the elementary uncertainty terms separated into two distinct categories. First of all, statistical terms are studied. Then, the other elementary uncertainty terms such as those linked to the connection to international standards or manufacturer data, as well as the elementary terms linked to variations in environmental parameters such as temperature, acceleration, or hygrometry, or those linked to quantities studied such as the wavelength of lasers or that linked to the misalignment of the beam in space. We illustrate this method with two examples, an optoelectronic oscillator and that of a Brillouin Light Scattering measurement system.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Patrice Salzenstein "Uncertainty estimation in optics and optoelectronic systems", Proc. SPIE 13241, Optical Metrology and Inspection for Industrial Applications XI, 132410I (20 November 2024); https://doi.org/10.1117/12.3036094

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