Measurements of x-ray reflectivities of Au-coatings at several energies

Allan Hornstrup; Finn Erland Christensen; Jorgen Garnaes; Ellen Jespersen; Shou-Hua Zhu; Herbert W. Schnopper

doi:10.1117/12.22811

1 November 1990 Measurements of x-ray reflectivities of Au-coatings at several energies

Allan Hornstrup, Finn Erland Christensen, Jorgen Garnaes, Ellen Jespersen, Shou-Hua Zhu, Herbert W. Schnopper

Author Affiliations +

Proceedings Volume 1333, Advanced Optical Manufacturing and Testing; (1990) https://doi.org/10.1117/12.22811
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

We present the results of an extensive study of X-ray reflectivities of dip lacquered and Au coated Al foils. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. We show, that two of three examined versions of a density variation model are able to explain the data. We fmd a strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates. We present data suggesting important correspondence between X-ray measurements and scanning tunneling microscopy measurements. We fmd no dependence on curing temperatures (70°C to 130°C). Finally, we have performed an energy scan of one of the foils, in the range 6 keV to 12 keV.

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Allan Hornstrup, Finn Erland Christensen, Jorgen Garnaes, Ellen Jespersen, Shou-Hua Zhu, and Herbert W. Schnopper "Measurements of x-ray reflectivities of Au-coatings at several energies", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); https://doi.org/10.1117/12.22811

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