On-machine measurement of roughness, waviness, and flaws

Lionel R. Baker

doi:10.1117/12.22809

1 November 1990 On-machine measurement of roughness, waviness, and flaws

Lionel R. Baker

Author Affiliations +

Proceedings Volume 1333, Advanced Optical Manufacturing and Testing; (1990) https://doi.org/10.1117/12.22809
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Recent developnients in the technology of surface generation are directed towards higher quality and reduced costs using an everincreasing range of optical materials. These goals require the use of objective methods of measurement to ensure that the desired end- points are within thresholds of acceptance at the instant these occur. This paper reviews progress in the development of methods of measurement of surface roughness, waviness and flaws which are likely to be suitable for on-machine use which could be traceable to National Standards, and which might provide outputs suitable for linking the process of design, manufacture and testing necessary to ensure total quality management. Results from recent laboratory assessments on a variety of surface characteristics are presented to illustrate the potential of the methods described.

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Lionel R. Baker "On-machine measurement of roughness, waviness, and flaws", Proc. SPIE 1333, Advanced Optical Manufacturing and Testing, (1 November 1990); https://doi.org/10.1117/12.22809

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