Paper
12 December 2024 Simulation study on the influence factors of dynamic capacitance of SF6 circuit breaker during breaking
Feiyue Ma, Chuxiong Xu, Bo Niu, Yu Wang, Hui Ni, Beiyang Liu
Author Affiliations +
Proceedings Volume 13419, Tenth International Conference on Energy Materials and Electrical Engineering (ICEMEE 2024); 1341934 (2024) https://doi.org/10.1117/12.3050466
Event: Tenth International Conference on Energy Materials and Electrical Engineering (ICEMEE 2024), 2024, Lhasa, China
Abstract
SF6 circuit breakers are widely used in power system. Due to the accumulation of arc ablative effect, the arc contact state of SF6 circuit breakers deteriorates continuously, which will lead to the decline of the insulation grade and breaking capacity of the break chamber. The dynamic capacitance simulation model of SF6 circuit breaker was established, and the dynamic capacitance influencing factors were studied. Simulation study of the static arc contact length, static arc contact ablation angle, dynamic arc contact inner diameter and arc contact surface fluoride on the dynamic capacitance characteristics. The establishment of a comprehensive consideration of deterioration caused by various changes in the contact simulation model and test results for comparison, the results show that with the increase in the degree of comprehensive deterioration, the dynamic capacitance curve just split point travel down, just split point capacitance rise, completely split point capacitance is unchanged, the rule of change and the test results are consistent with the validity of the contact deterioration model.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Feiyue Ma, Chuxiong Xu, Bo Niu, Yu Wang, Hui Ni, and Beiyang Liu "Simulation study on the influence factors of dynamic capacitance of SF6 circuit breaker during breaking", Proc. SPIE 13419, Tenth International Conference on Energy Materials and Electrical Engineering (ICEMEE 2024), 1341934 (12 December 2024); https://doi.org/10.1117/12.3050466
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KEYWORDS
Capacitance

Ablation

Device simulation

Fluoride

Vacuum chambers

Electric fields

Dielectrics

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