Paper
12 December 2024 Research on the failure mechanism of closing resistance under impulse current
Yanyan Bao, Guangdong Zhang, Feng Wang, Dingjun Wen, Pin Jiang, Yu Zhan
Author Affiliations +
Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 134390H (2024) https://doi.org/10.1117/12.3055376
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China
Abstract
As a key component of the tank circuit breaker, the closing resistance mainly inhibits the closing inrush current of the circuit breaker in the process of opening and closing, and accidents occur frequently during operation. Based on this, the thermal and mechanical simulation model of the closing resistance is established to analysis the failure of the impact current on the closing resistance; Firstly, the temperature rise process under different impact accurent with the amplitudes of 1.12kA, 1.68kA and 2.24kA respectively. Then and the stress distribution is also calculated. The results show that Excessive impact current causes faster temperature rise, which can lead to thermal damage of the closing resistor. While the impulse current reaches about 1.76kA, the average stress of the closing resistance reaches the material limited stress of the closing resistance and the maximum stress is on the outer edge, so it turns out the early destruction occurs this place. These conclusions can guide the analysis of the failure mechanism of the closing resistor.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yanyan Bao, Guangdong Zhang, Feng Wang, Dingjun Wen, Pin Jiang, and Yu Zhan "Research on the failure mechanism of closing resistance under impulse current", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 134390H (12 December 2024); https://doi.org/10.1117/12.3055376
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KEYWORDS
Resistance

Failure analysis

Device simulation

Temperature distribution

Resistors

Analytical research

Temperature metrology

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