Paper
1 December 1991 Preliminary study of the admittance diagram as a useful tool in the design of stripline components at microwave frequencies
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Abstract
It has been shown that the Admittance Diagram along with the Quarterwave Rule can be used in the design and characterization of optical thin film coatings. However, this same tool may be utilized in the design and characterization of some microwave components as well. A simple design example of a Wilkinson power divider is presented to illustrate the utility of this optical technique for microwave circuit design and analysis.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charmaine Cisneros Franck and Jerome B. Franck "Preliminary study of the admittance diagram as a useful tool in the design of stripline components at microwave frequencies", Proc. SPIE 1527, Current Developments in Optical Design and Optical Engineering, (1 December 1991); https://doi.org/10.1117/12.48658
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Thin films

Microwave radiation

Phase shifts

Reflectivity

Optical design

Glasses

Optical engineering

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