Paper
29 July 1992 Thermal transport studies of diamond thin films
Zhouling Wu, H. Gronbeck, X. Su, Zhengxiu Fan
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Abstract
The thermal transport behavior of CVD diamond films with different thicknesses (1 - 100 micrometers ) has been investigated by high frequency modulated photothermal reflectance technique. By analyzing the frequency dependent phase behavior of the laser-induced thermal waves, we have obtained the thermal conductivity of the samples as well as the thermal resistance at the film-substrate interfaces. With the tabled values of the density and the specific heat, we then calculate the thermal diffusivities and compare them with previously reported data on similar samples. The results demonstrate the technique a powerful tool for investigating the demanding diamond coatings.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhouling Wu, H. Gronbeck, X. Su, and Zhengxiu Fan "Thermal transport studies of diamond thin films", Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); https://doi.org/10.1117/12.60115
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KEYWORDS
Diamond

Thin films

Chemical vapor deposition

Interfaces

Modulation

Reflectivity

Resistance

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