Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces

Sheldon M. Smith

doi:10.1117/12.140690

12 February 1993 Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces

Sheldon M. Smith

Proceedings Volume 1753, Stray Radiation in Optical Systems II; (1993) https://doi.org/10.1117/12.140690
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The manner in which diffraction can increase the reflectance measured from very rough surfaces is shown by observations of diffracted light within the instrument profile of a far-IR reflectometer system. A correction to the calibration signal based on numerical integration of the diffracted part of the instrument profile is described. Diffraction correction factors as large as 2.94 have been found with small optics at long wavelength (630 microns). The effect of diffraction on diffuse reflectance measurements of a very rough perfect reflector is shown at wavelengths from 56 to 200 microns.

Citation Download Citation

Sheldon M. Smith "Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces", Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); https://doi.org/10.1117/12.140690

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