Comparison of Si P-I-N diodes and thermoluminescent detector responses in the soft x-ray region

Josef Krasa; M. Pietrikova; Libor Juha; Milos Chvojka; Bozena Kralikova; Karel Masek; Jiri Skala; E. Krousky; J. Trousil; J. Plichta; Anita Darickova

doi:10.1117/12.144508

23 April 1993 Comparison of Si P-I-N diodes and thermoluminescent detector responses in the soft x-ray region

Josef Krasa, M. Pietrikova, Libor Juha, Milos Chvojka, Bozena Kralikova, Karel Masek, Jiri Skala, E. Krousky, J. Trousil, J. Plichta, Anita Darickova

Author Affiliations +

Proceedings Volume 1980, Iodine Lasers and Applications; (1993) https://doi.org/10.1117/12.144508
Event: Iodine Lasers and Applications, 1992, Bechyne Castle, Czechoslovakia

Abstract

Comparative measurements of Si P-I-N diodes and thermoluminescent dosemeters responses to laser produced plasma soft x-ray radiation are reported. As dosemeters single crystals LiF:Mn,Ti TLD 100 and CaF₂:Dy TLD 200 were used. It is demonstrated that an enhanced response of the Si P-I-N diodes is a significant effect in a region of high dose rates.

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Josef Krasa, M. Pietrikova, Libor Juha, Milos Chvojka, Bozena Kralikova, Karel Masek, Jiri Skala, E. Krousky, J. Trousil, J. Plichta, and Anita Darickova "Comparison of Si P-I-N diodes and thermoluminescent detector responses in the soft x-ray region", Proc. SPIE 1980, Iodine Lasers and Applications, (23 April 1993); https://doi.org/10.1117/12.144508

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