Recent advances in avalanche photodiode technology

Michael R. Squillante; Jeffrey S. Gordon; Richard Farrell; Stefan A. Vasile; Kathleen Daley; Carlton E. Oakes; K. Vanderpuye

doi:10.1117/12.164749

16 December 1993 Recent advances in avalanche photodiode technology

Michael R. Squillante, Jeffrey S. Gordon, Richard Farrell, Stefan A. Vasile, Kathleen Daley, Carlton E. Oakes, K. Vanderpuye

Author Affiliations +

Proceedings Volume 2009, X-Ray Detector Physics and Applications II; (1993) https://doi.org/10.1117/12.164749
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Avalanche photodiodes (APDs) are solid state devices having an internal signal gain which gives them a better signal-to-noise ratio than standard photodiodes. Although they have been studied for years, recent advances in the fabrication techniques have allowed the construction of multielement arrays (up to 10 X 10) with high performance capability. This progress has resulted in increased potential for exploiting the advantages of APDs in a variety of important applications including measurements requiring fast response such as nuclear and high energy physics research, industrial nondestructive testing, medical instrumentation, and biomedical research using low energy particles. Recent experimental data characterizing APDs and APD arrays used as x-ray, particle, and low level light detectors are presented.

Citation Download Citation

Michael R. Squillante, Jeffrey S. Gordon, Richard Farrell, Stefan A. Vasile, Kathleen Daley, Carlton E. Oakes, and K. Vanderpuye "Recent advances in avalanche photodiode technology", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164749

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