Paper
15 February 1994 Masks for Markle-Dyson optics
Andrew Grenville, Gerry Owen, Jeff A. Robinson, David Anthony Borkholder, Curtis W. Frank, Roger Fabian W. Pease, David A. Markle
Author Affiliations +
Abstract
The optical performance of Markle-Dyson projection optics is now well established. Here we describe options for 1X reflective optical masks that might achieve the desired linewidth control. One option is the use of aluminum as the reflecting material. A film less than 50 nm thick has nearly twice the reflectivity of the silicon used until now, and so it should be possible to develop an etching process (for such a thin film) that is adequately precise. Moreover options exist for repairing both opaque and clear defects. An interesting alternative configuration, that eliminates the need to etch the aluminum, is to use a patterned absorber on the substrate and to deposit the aluminum over the patterned absorber.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew Grenville, Gerry Owen, Jeff A. Robinson, David Anthony Borkholder, Curtis W. Frank, Roger Fabian W. Pease, and David A. Markle "Masks for Markle-Dyson optics", Proc. SPIE 2087, 13th Annual BACUS Symposium on Photomask Technology and Management, (15 February 1994); https://doi.org/10.1117/12.167246
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KEYWORDS
Photomasks

Etching

Reflectivity

Aluminum

Reflectors

Reflection

Quartz

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