Inversion channel detection circuits for optoelectronic interconnect

Geoffrey W. Taylor; Patrik A. Evaldsson; Timothy A. Vang; Philip A. Kiely

doi:10.1117/12.174504

2 May 1994 Inversion channel detection circuits for optoelectronic interconnect

Geoffrey W. Taylor, Patrik A. Evaldsson, Timothy A. Vang, Philip A. Kiely

Proceedings Volume 2153, Optoelectronic Interconnects II; (1994) https://doi.org/10.1117/12.174504
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

The inversion channel technology is a new approach to monolithic optoelectronic integration that offers the possibility of FET logic, optical detection, and laser emission from a single chip. The detection is performed by the three terminal configuration of the DOES biased in the off state. Incident light switches the DOES into the on state and recovery from the on state is provided by the conduction of electrons from the inversion channel through a FET connected to the third terminal. In this paper we demonstrate the functionality of this operation with an OEIC that integrates the three terminal DOES device with four FETs. The operation is discussed both as an optical clock and as an electrically clocked optical gate. Sensitivity issues are considered.

Citation Download Citation

Geoffrey W. Taylor, Patrik A. Evaldsson, Timothy A. Vang, and Philip A. Kiely "Inversion channel detection circuits for optoelectronic interconnect", Proc. SPIE 2153, Optoelectronic Interconnects II, (2 May 1994); https://doi.org/10.1117/12.174504

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