Automatic analysis of optical time domain reflectometer (OTDR) measurement results

Andrezej Kowalski; S. Kuklinski; A. Zakrzewski

doi:10.1117/12.203324

1 March 1995 Automatic analysis of optical time domain reflectometer (OTDR) measurement results

Andrezej Kowalski, S. Kuklinski, A. Zakrzewski

Proceedings Volume 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing; (1995) https://doi.org/10.1117/12.203324
Event: Laser Technology: Fourth Symposium, 1993, Szczecin, Poland

Abstract

In the paper the influence of noise on automated detection and analysis of splices in long optical telecommunication lines is discussed.

Citation Download Citation

Andrezej Kowalski, S. Kuklinski, and A. Zakrzewski "Automatic analysis of optical time domain reflectometer (OTDR) measurement results", Proc. SPIE 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing, (1 March 1995); https://doi.org/10.1117/12.203324

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