Luminescent x-ray polarimeter

Igor P. Tindo; Israel L. Beigman

doi:10.1117/12.186677

14 September 1994 Luminescent x-ray polarimeter

Igor P. Tindo, Israel L. Beigman

Proceedings Volume 2265, Polarization Analysis and Measurement II; (1994) https://doi.org/10.1117/12.186677
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

A new type of sensitive X-ray polarimeter is proposed, based on the measurement of the azimuthal anysotropy of the angular distribution of the photoelectrons produced by photoabsorption of the infalling X-ray photons in the luminescent X-ray converter. The latter is a 3(2)-dimensional structure consisting of the luminescent (scintillating) two-component elements - thin fibers or films, the diameters (thickness) of which is smaller as the penetration depth of the photoelectrons. The device can be used at the hot plasma diagnostics in space-based astrophysical experiments and in laboratory.

Citation Download Citation

Igor P. Tindo and Israel L. Beigman "Luminescent x-ray polarimeter", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); https://doi.org/10.1117/12.186677

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