Polarization sensitivity modeling of reflective imaging systems

Conrad Wells

doi:10.1117/12.186675

14 September 1994 Polarization sensitivity modeling of reflective imaging systems

Conrad Wells

Proceedings Volume 2265, Polarization Analysis and Measurement II; (1994) https://doi.org/10.1117/12.186675
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Polarization modeling of imaging systems has assumed more importance in recent earth remote sensing systems. Santa Barbara Research Center (SBRC) has developed computer programs that model the polarization characteristics of optical systems. This single ray simplified approach can be used when coating design information is not available or for modeling of an as built instrument using measured component data. For systems without exotic coating designs, the polarization ray trace capability of the optical design program CodeV is used to perform polarization modeling. Two polarization modeling case studies are reported. Measured component data is used for single ray modeling of the Moderate Resolution Imaging Spectroradiometer (MODIS) sensor currently being built at SBRC. CodeV was used to model the full bundle of a five mirror off axis unobstructed ground based calibrator.

Citation Download Citation

Conrad Wells "Polarization sensitivity modeling of reflective imaging systems", Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); https://doi.org/10.1117/12.186675

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