Characterization of concave-curved diffractors for spectrometers in 2D x-ray optical instrumentations

William Z. Chang; O. Wehrhan; Eckhart Foerster; Felix N. Chukhovskii

doi:10.1117/12.193155

11 November 1994 Characterization of concave-curved diffractors for spectrometers in 2D x-ray optical instrumentations

William Z. Chang, O. Wehrhan, Eckhart Foerster, Felix N. Chukhovskii

Proceedings Volume 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics; (1994) https://doi.org/10.1117/12.193155
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Characterization of bent crystals used in x-ray spectroscopic instrumentation is carried out, which includes different methods for measuring the reflection curves of bent crystals and integrated reflectivities. The integrated reflectivities of a cylindrically bent PET crystal within the wavelength range of 0.3 - 0.8 nm are presented. The measured data are compared with calculations using both kinematic and dynamic theories. Based upon the x-ray dynamic theory of bent crystals, the optimal selection of the x-ray wavelength, crystal reflections and bending radius, which are necessary to observe the fine details of the reflection curve, are determined. To obtain both the energy band and the angular width of the probing beam in the order of 10^-5 radian, a double-crystal spectrometer in a dispersive configuration, which consists of quartz (20.3) symmetric and silicon (111) asymmetric reflections, is suggested. As a result, the former has a nearly normal incident case, which makes possible a (Delta) (lambda) /(lambda) value of approximate 2 X 10^-5; the latter reflection contributes mainly to the reduction of the angular width of the diffracted beam. A rotating device with high angular precision to measure the reflection curve is discussed.

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William Z. Chang, O. Wehrhan, Eckhart Foerster, and Felix N. Chukhovskii "Characterization of concave-curved diffractors for spectrometers in 2D x-ray optical instrumentations", Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); https://doi.org/10.1117/12.193155

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KEYWORDS

Crystals

Reflection

X-rays

Reflectivity

Laser crystals

Spectrometers

Silicon

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