Tolerance analysis of the Far Ultraviolet Spectroscopic Explorer (FUSE): a statistical approach

Erik Wilkinson; James C. Green; David J. Sahnow

doi:10.1117/12.193193

7 November 1994 Tolerance analysis of the Far Ultraviolet Spectroscopic Explorer (FUSE): a statistical approach

Erik Wilkinson, James C. Green, David J. Sahnow

Proceedings Volume 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry; (1994) https://doi.org/10.1117/12.193193
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

We present a new statistical technique for evaluating the error budget of an optical system. Each parameter evaluated in the error budget is assigned a standard deviation. Randomly generated, Gaussian distributed offsets are then generated for each parameter. The optical system is raytraced a large number of times using the offsets to simulate alignment errors. In this way it is straightforward to simultaneously evaluate the degradation in the optical performance introduced by random misalignments and fabrication errors. The error budget for a system is then defined in terms of the standard deviations assigned to each parameter under consideration.

Citation Download Citation

Erik Wilkinson, James C. Green, and David J. Sahnow "Tolerance analysis of the Far Ultraviolet Spectroscopic Explorer (FUSE): a statistical approach", Proc. SPIE 2283, X-Ray and Ultraviolet Spectroscopy and Polarimetry, (7 November 1994); https://doi.org/10.1117/12.193193

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