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A model describing the mechanism of solid-state film diffusion into oxide substrates was developed and shown to
accurately predict the dopant concentration profiles1 . The model coupled oxidation of the dopant at the metal-substrate
interface with field assisted diffusion of the resulting metal ions into the substrate. The model, an adequate description of the
process once initiated, could not explain how the diffusion process starts nor the experimental behavior observed at low
electric fields (< 25 V/cm). This current work investigates the initiation of solid-state film ion exchange (Ag+ Na+) in glass
substrates. In this paper we establish the fundamental space charge origin of the initiation process and show how this space
charge gives rise to the Mott potential necessary for initiating the oxidation of the metal dopant. A one-dimensional, charge
transport model is presented considering the development of space-charge effects in glass having two charge-blocking
electrodes. The model results indicate that the rate limiting step for initiating Ag+ diffusion in glass is the motion of oxygen
ions towards the silver anode. The predictions of this model compare favorably with the "dead times" observed in the current
vs. time curves during ion-exchange. The dead time corresponds to the accumulation oxygen ions at the metal-glass interface
and consequently, a period of negligible diffusion of silver into the glass. The absence of silver diffusion during this period
was confirmed by analyzing the surface composition of the glass using Rutherford backscattering analysis (RBS).
Dixit Kapila andJoel L. Plawsky
"Charge transport and the mechanism for solid state film diffusion in integrated optical waveguide glass substrates", Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); https://doi.org/10.1117/12.190916
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Dixit Kapila, Joel L. Plawsky, "Charge transport and the mechanism for solid state film diffusion in integrated optical waveguide glass substrates," Proc. SPIE 2291, Integrated Optics and Microstructures II, (21 October 1994); https://doi.org/10.1117/12.190916