Nondestructive testing of subsurface defects measurement by photothermal tomographic imaging

Shaoqun Zeng; Haifeng Xu; Xiande Liu; Qingming Luo; Dinghe Shi; Dading Chang; Zaiguang Li

doi:10.1117/12.182161

5 August 1994 Nondestructive testing of subsurface defects measurement by photothermal tomographic imaging

Shaoqun Zeng, Haifeng Xu, Xiande Liu, Qingming Luo, Dinghe Shi, Dading Chang, Zaiguang Li

Author Affiliations +

Proceedings Volume 2321, Second International Conference on Optoelectronic Science and Engineering '94; (1994) https://doi.org/10.1117/12.182161
Event: Optoelectronic Science and Engineering '94: International Conference, 1994, Beijing, China

Abstract

Photothermal tomographic imaging is investigated in this paper. A new reconstruction model is proposed according to the thermal wave physics and our experiment setup. It was observed that the position and shape of the subsurface defects are more accurately reproduced in this method of reconstruction. Defects overlapped in depth direction is also resolved.

Citation Download Citation

Shaoqun Zeng, Haifeng Xu, Xiande Liu, Qingming Luo, Dinghe Shi, Dading Chang, and Zaiguang Li "Nondestructive testing of subsurface defects measurement by photothermal tomographic imaging", Proc. SPIE 2321, Second International Conference on Optoelectronic Science and Engineering '94, (5 August 1994); https://doi.org/10.1117/12.182161

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