Paper
26 May 1995 Automatic optical proximity correction with optimization of stepper condition
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Abstract
A simulated annealing, one of the optimization algorithms, has been applied to the optical proximity correction. Using attenuating phase shifting mask with annular illumination, the stepper condition as well as mask design has been optimized to correct line shortening for typical cell array pattern of dynamic random access memory. A cost function has been designed to reflect the desired dose-window and depth of focus obtained by ED-tree analysis. The performances of escape from a local minimum and the convergency have been demonstrated. Then all parameters that dominated the optical proximity effect have been optimized to minimize the cost function under practical constraints.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soichi Inoue, Tadahito Fujisawa, Satoshi Tanaka, Shoji Mimotogi, Akiko Nikki, and Ichiro Mori "Automatic optical proximity correction with optimization of stepper condition", Proc. SPIE 2440, Optical/Laser Microlithography VIII, (26 May 1995); https://doi.org/10.1117/12.209255
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KEYWORDS
Optical proximity correction

Annealing

Photomasks

Optimization (mathematics)

Algorithms

Phase shifting

Monte Carlo methods

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