Paper
1 September 1995 New approach to the analysis of IR images
Mohamed-Adel Slamani, David D. Ferris Jr., Vincent C. Vannicola
Author Affiliations +
Abstract
In signal processing applications it is common to assume a Gaussian problem in the design of optimal signal processors. However, non-Gaussian processes do arise in many situations. When the possibility of a non-Gaussian problem is encountered, the question as to which probability distributions should be utilized in a specific situation for modeling the data needs to be answered. In practice, the underlying probability distributions are not known a priori. Consequently, an assessment must be made by monitoring the environment to subdivide for each patch. In this paper, an automatic statistical characterization and partitioning of environments process, previously used on simulated data, is applied to real data of an IR image. Two separate procedures are used to determine all homogeneous patches and subpatches in the IR image. The first procedure, referred to as the mapping procedure, is used to separate contiguous homogeneous regions by segregating between their power levels. The second procedure, referred to as the statistical procedure, separates contiguous homogeneous regions by segregating between their probabilistic data distributions. The latter procedure makes use of Ozturk algorithm, a newly developed algorithm for analyzing random data. Furthermore, the statistical procedure identifies suitable approximations to the probability density function for each homogeneous patch and determines the location of outliers. Convergence of the procedures is controlled by an expert system shell.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mohamed-Adel Slamani, David D. Ferris Jr., and Vincent C. Vannicola "New approach to the analysis of IR images", Proc. SPIE 2561, Signal and Data Processing of Small Targets 1995, (1 September 1995); https://doi.org/10.1117/12.217671
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KEYWORDS
Signal processing

Algorithm development

Image processing

Infrared imaging

Sensors

Edge detection

Data modeling

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