Tunable Optical Filter Using An Interferometer For Selective Modulation

Roy W. Esplin; Ronald J. Huppi; Marshall H. Bruce; George A. Vanasse

doi:10.1117/12.959935

21 July 1981 Tunable Optical Filter Using An Interferometer For Selective Modulation

Roy W. Esplin, Ronald J. Huppi, Marshall H. Bruce, George A. Vanasse

Proceedings Volume 0268, Imaging Spectroscopy I; (1981) https://doi.org/10.1117/12.959935
Event: 1981 Los Angeles Technical Symposium, 1980, Los Angeles, United States

Abstract

Using the selective modulation interferometric spectrometer (SIMS) as a tunable filter is proposed. This tunable filter can have a large optical throughput and a resolving power on the order of a few thousand. A basic explanation of the operation of this filter is given with an emphasis on the similarities and differences between it and a Fourier spectrometer. Several equations that have been found to be particularly useful in designing, operating, and calibrating this filter are presented. The construction and operation of a tunable filter prototype are reported.

Citation Download Citation

Roy W. Esplin, Ronald J. Huppi, Marshall H. Bruce, and George A. Vanasse "Tunable Optical Filter Using An Interferometer For Selective Modulation", Proc. SPIE 0268, Imaging Spectroscopy I, (21 July 1981); https://doi.org/10.1117/12.959935

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