Paper
19 August 1996 Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process
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Abstract
Substrate properties, coating design, and deposition process determine the surface morphology of optical coatings. The contribution of each factor can be estimated by measuring the surface topography with a scanning force microscope (SFM) and calculating the power spectral density functions. We present results for oxide and fluoride coatings on well polished glass and silicon substrates. The scattering of the coatings is predicted by calculations based on SFM data and compared with results from angle resolved scattering measurements.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan Jakobs, Torsten Feigl, Angela Duparre, and Stephan Pichlmaier "Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process", Proc. SPIE 2776, Developments in Optical Component Coatings, (19 August 1996); https://doi.org/10.1117/12.246814
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Cited by 2 scholarly publications.
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KEYWORDS
Scattering

Atomic force microscopy

Spatial frequencies

Roentgenium

Laser scattering

Silicon

Electron beams

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