Paper
19 August 1996 Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition
Pavel V. Bulkin, Pieter L. Swart, Beatrys M. Lacquet, Anatoli A. Chtcherbakov
Author Affiliations +
Abstract
The computer-controlled electron cyclotron resonance plasma enhanced chemical vapor deposition of SiOxNy was used for the manufacturing of optical interference coatings with inhomogeneous and traditional multilayer refractive index profiles. Such complex structures as triple-band rugate optical interference filters and graded refractive index antireflection coatings were grown. The design of coatings was performed using measured optical constants of the SiOxNy-system.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel V. Bulkin, Pieter L. Swart, Beatrys M. Lacquet, and Anatoli A. Chtcherbakov "Deposition of conventional and gradient optical coatings by ECR plasma-enhanced chemical vapor deposition", Proc. SPIE 2776, Developments in Optical Component Coatings, (19 August 1996); https://doi.org/10.1117/12.246840
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Refractive index

Optical coatings

Reflectivity

Optical filters

Silicon

Optics manufacturing

Plasma enhanced chemical vapor deposition

Back to Top