Electron-beam diagnostics and emission characterization for single and multiple Spindt-type field emitters for rf amplifiers

Puroby M. Phillips; Kevin L. Jensen; Khank Nguyen; Lex Malsawma; C. Hor; E. G. Zaidman

doi:10.1117/12.262771

18 December 1996 Electron-beam diagnostics and emission characterization for single and multiple Spindt-type field emitters for rf amplifiers

Puroby M. Phillips, Kevin L. Jensen, Khank Nguyen, Lex Malsawma, C. Hor, E. G. Zaidman

Author Affiliations +

Proceedings Volume 2842, Millimeter and Submillimeter Waves and Applications III; (1996) https://doi.org/10.1117/12.262771
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Experimental measurements made on a single Spindt-type molybdenum field emitter are correlated with a simple analytic model of the electron distribution. The measurements were made by using a nanofabricated detector whose position relative to the emitted was determined using laser interferometry. Methods used to correlate theory with experiment are explained, and the dependence of the beam profile on tip sharpness, gate diameter, anode distance, and tip work function are examined. It is shown how the analytic model may be extended to find the trajectories needed for particle simulations. Analysis has shown that the rms spread angle is approximately 20 degrees.

Citation Download Citation

Puroby M. Phillips, Kevin L. Jensen, Khank Nguyen, Lex Malsawma, C. Hor, and E. G. Zaidman "Electron-beam diagnostics and emission characterization for single and multiple Spindt-type field emitters for rf amplifiers", Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); https://doi.org/10.1117/12.262771

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