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18 December 1996 Submillimeter wave response and noise in HTS Josephson junctions
Michael A. Tarasov, A. Ya. Shul'man, O. Yu. Polyansky, Zdravko G. Ivanov, G. Fischer, Erik L. Kollberg, Tord Claeson, E. Stepantsov
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Proceedings Volume 2842, Millimeter and Submillimeter Waves and Applications III; (1996) https://doi.org/10.1117/12.262784
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States
Abstract
The IV curves and the direct detector response of HTS bicrystal grain-boundary Josephson junctions have been measured under submm-wave irradiation at frequencies 350-750 GHz. The Josephson oscillation spectrum has been measured using the Hilbert transformation of detection response dependence. The Josephson oscillation linewidth and corresponding value of effective noise is compared to the estimates from the dc measurements of noise rounding of IV curve. To separate sources of noise the direct measurements of junction's output noise has been performed at 1.5 GHz and low frequencies 0.5-20 kHz.
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Michael A. Tarasov, A. Ya. Shul'man, O. Yu. Polyansky, Zdravko G. Ivanov, G. Fischer, Erik L. Kollberg, Tord Claeson, and E. Stepantsov "Submillimeter wave response and noise in HTS Josephson junctions", Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); https://doi.org/10.1117/12.262784
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KEYWORDS
Extremely high frequency
Sensors
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