X-ray detectors with micron resolution based on Kumakhov optics

Andrey N. Nikitin; Nariman S. Ibraimov; Svetlana V. Nikitina

doi:10.1117/12.245151

19 July 1996 X-ray detectors with micron resolution based on Kumakhov optics

Andrey N. Nikitin, Nariman S. Ibraimov, Svetlana V. Nikitina

Proceedings Volume 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications; (1996) https://doi.org/10.1117/12.245151
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The spatial resolution of the modern x-ray and neutron detectors is due to emission secondary particles. For fast x-rays this limit is connected with a range of secondary electrons and usually resolution is 20 microns; for neutrons, limit is connected with a range of (alpha) - particles and a resolution of 50 microns. It was shown that polycapillary Kumakhov optics can avoid this limit. We have carried out experiments on realization of this idea.

Citation Download Citation

Andrey N. Nikitin, Nariman S. Ibraimov, and Svetlana V. Nikitina "X-ray detectors with micron resolution based on Kumakhov optics", Proc. SPIE 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications, (19 July 1996); https://doi.org/10.1117/12.245151

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