Paper
24 September 1996 1.48-μm InGaAs/InGaAsP separated confinement strained layer multiple quantum well lasers
Haiyan An, Shuren Yang, Hong-Bo Sun, Yuheng Peng, Shiyong Liu
Author Affiliations +
Proceedings Volume 2886, Semiconductor Lasers II; (1996) https://doi.org/10.1117/12.251916
Event: Photonics China '96, 1996, Beijing, China
Abstract
In this report, InGaAs/InGaAsP separated confinement strained-layer multiple-quantum-well laser structures for 1.48micrometers emission wavelength have been grown by LP-MOVPE. The lasing characteristics of the dependence of threshold current densities on the inverse of cavity length and the dependence of threshold current on the cavity length have been studied with room temperature pulse operated broad-area lasers. To reduce the threshold current, the room temperature CW H+ ion implantation stripe lasers with varies widths have been fabricated. The stripe width dependence of threshold current for a set of these devices have also been investigated. Besides, to obtain a high output power from the front facet, we have studied the design of the facet reflective.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiyan An, Shuren Yang, Hong-Bo Sun, Yuheng Peng, and Shiyong Liu "1.48-μm InGaAs/InGaAsP separated confinement strained layer multiple quantum well lasers", Proc. SPIE 2886, Semiconductor Lasers II, (24 September 1996); https://doi.org/10.1117/12.251916
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KEYWORDS
Laser damage threshold

Reflectivity

Laser applications

Quantum wells

Waveguides

Continuous wave operation

Ion implantation

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