Performance limitations and practical considerations associated with resistive emitter array nonuniformity correction (NUC)

Douglas K. Moore; Clay J. Stanek; Curt Peterson

doi:10.1117/12.280942

15 July 1997 Performance limitations and practical considerations associated with resistive emitter array nonuniformity correction (NUC)

Douglas K. Moore, Clay J. Stanek, Curt Peterson

Author Affiliations +

Proceedings Volume 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II; (1997) https://doi.org/10.1117/12.280942
Event: AeroSense '97, 1997, Orlando, FL, United States

Abstract

Resistive array technology is finding increasing application in representing synthetic infrared targets and backgrounds. Pixel-to-pixel radiance nonuniformity is the prominent noise source from resistive arrays and must be compensated or otherwise mitigated for high-fidelity testing of infrared imaging sensors. Any imaging method for measuring and correcting nonuniformity noise is subject to theoretical performance limitations due to sensor measurement noise, geometrical resolution, background offset, and optical resolution. We derive general performance bounds as functions of sensor parameters, which are equally applicable to staring and scanning nonuniformity correction (NUC) sensors. A thorough understanding of the theoretical limitations of the process allows intelligent specification of the NUC sensor, procedures, algorithms, and processing power required for any scene projection application. We describe the NUC approach developed for the US Army's Dynamic Infrared Scene Projector (DIRSP). We also exhibit the features of our software package, which calculates emitter calibration curves from automatically collected laboratory data. We show how the code deals with practical considerations such as detector fill factor, incorrect magnification, rotation between emitter array and NUC sensor, optics anisoplanity, dead pixels, data overload, and automatic detection of emitter signals. The paper concludes by showing a glimpse of procedures, algorithms, and sensor to be used in the DIRSP.

Citation Download Citation

Douglas K. Moore, Clay J. Stanek, and Curt Peterson "Performance limitations and practical considerations associated with resistive emitter array nonuniformity correction (NUC)", Proc. SPIE 3084, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing II, (15 July 1997); https://doi.org/10.1117/12.280942

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available