Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals

Andrzej L. Bajor; Zbigniew Galazka

doi:10.1117/12.271808

1 April 1997 Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals

Andrzej L. Bajor, Zbigniew Galazka

Proceedings Volume 3094, Polarimetry and Ellipsometry; (1997) https://doi.org/10.1117/12.271808
Event: Polarimetry and Ellipsometry, 1996, Kazimierz Dolny, Poland

Abstract

In this work practical investigations of residual stresses in LiNbO₃ crystals measured by the computer-controlled imaging polarimeter are compared with theoretical model developed for oxide crystalline materials. A good qualitative agreement has been found between theory and experiment regarding residual stress distributions in wafers cut out perpendicularly to the crystal's growth axis.

Citation Download Citation

Andrzej L. Bajor and Zbigniew Galazka "Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals", Proc. SPIE 3094, Polarimetry and Ellipsometry, (1 April 1997); https://doi.org/10.1117/12.271808

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