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1 January 1998 Fringe pattern field analysis in planar waveguides investigation
Roman Rogozinski, Aleksander Opilski
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Proceedings Volume 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics; (1998) https://doi.org/10.1117/12.301331
Event: Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, 1996, Karpacz, Poland
Abstract
In the paper an analysis of a fringe pattern field with an observation of a chosen fringe course, for defining the profile of refractive index of planar waveguides are proposed. With an application of the measuring method described, refractive profiles of planar waveguides, produced in the soda-lime glass by means of an ion exchange Ag+ $ARLR Na+ were examined.
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Roman Rogozinski and Aleksander Opilski "Fringe pattern field analysis in planar waveguides investigation", Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); https://doi.org/10.1117/12.301331
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KEYWORDS
Fringe analysis
Waveguides
Planar waveguides
Refractive index
Glasses
Ion exchange
Prisms
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