Detection of subsurface defects

Zu-Han Gu; Zong Qi Lin; Michel A. Josse

doi:10.1117/12.328453

30 October 1998 Detection of subsurface defects

Zu-Han Gu, Zong Qi Lin, Michel A. Josse

Proceedings Volume 3426, Scattering and Surface Roughness II; (1998) https://doi.org/10.1117/12.328453
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We present the experimental results of the detection of subsurface defects which show that the memory effect (or the far-field correlation function) of speckle patterns is sensitive to a small local change under the rough surface geometry. We envision this property can be applied to inspection of a target buried in the background by speckle mapping.

Citation Download Citation

Zu-Han Gu, Zong Qi Lin, and Michel A. Josse "Detection of subsurface defects", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); https://doi.org/10.1117/12.328453

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