Automatic Test System For Infrared Detector And Charge-Coupled Device (CCD) Multiplexer Control And Data Acquisition

Charles Chandler

doi:10.1117/12.933747

28 December 1982 Automatic Test System For Infrared Detector And Charge-Coupled Device (CCD) Multiplexer Control And Data Acquisition

Charles Chandler

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Proceedings Volume 0344, Infrared Sensor Technology; (1982) https://doi.org/10.1117/12.933747
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

Automatic test of IR detectors and CCD devices is accomplished by connecting programmable test equipment to a minicomputer. Digital signals from a timing generator are converted to analog levels and applied to the CCD. Video output from the CCD is digitized and transferred via a buffer memory into the computer for analysis. The device temperature, IR irradiance level and applied voltages are variable under program control. Measured device parameters are printed on paper and saved in machine-readable form as data base files. The device under test can be a packaged die mounted in a dewar or be in wafer form on the wafer prober.

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Charles Chandler "Automatic Test System For Infrared Detector And Charge-Coupled Device (CCD) Multiplexer Control And Data Acquisition", Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); https://doi.org/10.1117/12.933747

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KEYWORDS

Charge-coupled devices

Semiconducting wafers

Multiplexers

Power supplies

Clocks

Cadmium sulfide

Infrared sensors

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