Paper
19 November 1998 X-ray CCD calibration for the AXAF CCD Imaging Spectrometer
Mark W. Bautz, Michael J. Pivovaroff, F. Baganoff, Takashi Isobe, Stephen E. Jones, Steven E. Kissel, Beverly LaMarr, Herbert L. Manning, Gregory Y. Prigozhin, George R. Ricker Jr., John A. Nousek, Catherine E. Grant, Kaori Nishikida, Frank Scholze, R. Thornagel, Gerhard Ulm
Author Affiliations +
Abstract
Acquisition of ground calibration data from the AXAF CCD Imaging Spectrometer, one of two focal plane instruments on NASA's Advanced X-ray Astrophysics Facility, was completed in 1997. Here we summarize results of the detector level calibration effort. Our calibration program has included measurements of CCD response to undispersed synchrotron radiation, measurements of x-ray absorption fine structure, and of sub-pixel structure in the detector. Errors in the energy scale are at the level of a few tenths of one percent, and detection efficiency errors are no large than a few percent. We have also obtained new insights into the mechanisms by which the CCD gate structure and channel stops influence the CCD spectral redistribution function.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mark W. Bautz, Michael J. Pivovaroff, F. Baganoff, Takashi Isobe, Stephen E. Jones, Steven E. Kissel, Beverly LaMarr, Herbert L. Manning, Gregory Y. Prigozhin, George R. Ricker Jr., John A. Nousek, Catherine E. Grant, Kaori Nishikida, Frank Scholze, R. Thornagel, and Gerhard Ulm "X-ray CCD calibration for the AXAF CCD Imaging Spectrometer", Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); https://doi.org/10.1117/12.331238
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Cited by 89 scholarly publications.
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KEYWORDS
Sensors

Charge-coupled devices

Calibration

X-rays

Silicon

Data modeling

CCD image sensors

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