Chemical alteration of microchannel-plate EUV quantum efficiency

Jerry Edelstein; John V. Vallerga

doi:10.1117/12.330298

10 November 1998 Chemical alteration of microchannel-plate EUV quantum efficiency

Jerry Edelstein, John V. Vallerga

Proceedings Volume 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX; (1998) https://doi.org/10.1117/12.330298
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We report upon our continued investigation of a chemical treatment method for improving the quantum detection efficiency and gain of photon counting microchannel plate detectors for vacuum UV and soft x-radiation. The process improved MCP quantum detection efficiency for approximately 100-1200 angstrom radiation by a factor of 1.5-2. The performance results of DIP treated microchannel plates are summarized.

Citation Download Citation

Jerry Edelstein and John V. Vallerga "Chemical alteration of microchannel-plate EUV quantum efficiency", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330298

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