Paper
10 November 1998 Efficiency loss of lumogen-coated CCDs by exposure to ultraviolet and extreme ultraviolet photons
Richard C. Catura, Dexter W. Duncan, Lawrence Shing, Theodore D. Tarbell, C. Jacob Wolfson
Author Affiliations +
Abstract
The efficiency of lumogen coated CCDs has been measured as a function of wavelength in the range from 171 angstrom to 1800 angstrom. A decrease in efficiency has been observe as a function of exposure of the lumogen to high levels of radiation at UV and extreme UV wavelengths. The drop in efficiency was found to be most rapid at lower exposure levels, decreasing in rate as the dosage increased.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard C. Catura, Dexter W. Duncan, Lawrence Shing, Theodore D. Tarbell, and C. Jacob Wolfson "Efficiency loss of lumogen-coated CCDs by exposure to ultraviolet and extreme ultraviolet photons", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330286
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Photons

Ultraviolet radiation

Extreme ultraviolet

Optical filters

Mirrors

Silicon

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