Resonant measurement techniques using backward wave oscillators

William H. Henderson; George Gruner

doi:10.1117/12.331168

13 November 1998 Resonant measurement techniques using backward wave oscillators

William H. Henderson, George Gruner

Proceedings Volume 3465, Millimeter and Submillimeter Waves IV; (1998) https://doi.org/10.1117/12.331168
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We discuss two types of resonant techniques for measuring the electrodynamic properties of conductors in the millimeter and sub-millimeter wave spectral ranges. Using a series of backward wave oscillator sources, we can obtain essentially complete coverage of the frequency range 30 - 1000 GHz. At 100 GHz and below, cylindrical cavity resonators operating the in their TE₀₁₁ mode are employed to measure both components of the complex surface impedance of bulk samples. Above approximately 100 GHz, a Fabry-Perot resonator, consisting of a sapphire plate with a conducting sample placed against one side, is used. Both thin film and bulk samples may be measured with this technique. We focus on measurement on thin film samples, where the complex conductivity can be obtained directly from the transmission spectra.

Citation Download Citation

William H. Henderson and George Gruner "Resonant measurement techniques using backward wave oscillators", Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); https://doi.org/10.1117/12.331168

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