Absolute photoluminescence quantum yield of molecular organic thin films: effects of doping with strongly fluorescent rubrene

Hedi M. Mattoussi; Hideyuki Murata; Charles D. Merritt; Zakya H. Kafafi

doi:10.1117/12.332634

16 December 1998 Absolute photoluminescence quantum yield of molecular organic thin films: effects of doping with strongly fluorescent rubrene

Hedi M. Mattoussi, Hideyuki Murata, Charles D. Merritt, Zakya H. Kafafi

Author Affiliations +

Proceedings Volume 3476, Organic Light-Emitting Materials and Devices II; (1998) https://doi.org/10.1117/12.332634
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We present data on the absolute photoluminescence quantum yield (phi) _PL, for a set of pure and molecularly doped organic solid films. The procedure uses an integrating sphere to provide accurate measure of the photoluminescence efficiency for solid, sub-micron thickness, films. Host materials include a common hole transport compounds, N,N- dipheny-N,N-bis(3-methylphenyl)-1,1-biphenyl-4,4-diamine, TPD, and two metal chelates used as electron transport and/or light emitting materials, tris (8- hydroxyquinolinolato) aluminum (III), Alq₃, and one of its methyl derivatives, tris (8- trimethylhydroxyquinolinolator) aluminum (III), Almq₃, Tetraphenylnapthacene, or rubrene, is used as the dopant. A substantial increase in (phi) _PL is measured with respect to the pure host. For example, the measured (phi) _PL increases from 0.25 and 0.40 for pure Alq₃ and Almq₃, respectively, to near unity upon doping with rubrene at approximately 1 mol percent. The data are discussed within the framework of Foerster energy transfer.

Citation Download Citation

Hedi M. Mattoussi, Hideyuki Murata, Charles D. Merritt, and Zakya H. Kafafi "Absolute photoluminescence quantum yield of molecular organic thin films: effects of doping with strongly fluorescent rubrene", Proc. SPIE 3476, Organic Light-Emitting Materials and Devices II, (16 December 1998); https://doi.org/10.1117/12.332634

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