Paper
30 September 1998 Uncertainties in the measurement of gauge blocks by interferometry
Yu-Pin Lan, Wei-Cheng Chang
Author Affiliations +
Abstract
The uncertainties in the measurement of gauge blocks by interferometry based on the official publication of the ISO 'Guide to the Expression of Uncertainty in Measurement', are evaluated. The effects caused by a variety of factors such as laser frequency, refractive index of air, temperature and wringing film thickness are analyzed. The evaluation results how that for steel gauge blocks of grade 00, the expanded uncertainty is 0.04 micrometers + 14 X 10-7L where L is the length of the gauge block. The reported uncertainty is based on a standard uncertainty multiplied by a coverage factor of k equals 1.96, which provides a level of confidence of 95 percent.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu-Pin Lan and Wei-Cheng Chang "Uncertainties in the measurement of gauge blocks by interferometry", Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); https://doi.org/10.1117/12.323114
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KEYWORDS
Calibration

Interferometry

Interferometers

Refractive index

Temperature metrology

Image processing

Silicon

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