Paper
27 April 1999 Intrapixel response test system for multispectral characterization
Thomas A. Lind, Robert K. Reich, William H. McGonagle, Bernard B. Kosicki
Author Affiliations +
Abstract
We report on the design of a system used to measure the multispectral intrapixel response of imaging sensor arrays. An Airy disk spot size of approximately 4 micrometers has been achieved for wavelength bands that extend from the visible blue to near IR. The automated system does rapid intrapixel row and/or column spatial mapping of individual pixels as well as rastered 2D spatial scans over multi-pixel girds. Commercially available equipment including a photometric eyepiece, a reflective objects, programmable pushers, and light-emitting diodes are utilized in the system. Scanned results using the system are presented for both front- and back-illuminating charge-coupled device imagers. The intrapixel response of a front-illuminated device shows good correlation with the physical cross section of the devices tested.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas A. Lind, Robert K. Reich, William H. McGonagle, and Bernard B. Kosicki "Intrapixel response test system for multispectral characterization", Proc. SPIE 3649, Sensors, Cameras, and Systems for Scientific/Industrial Applications, (27 April 1999); https://doi.org/10.1117/12.347080
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Cited by 1 scholarly publication.
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KEYWORDS
Charge-coupled devices

Imaging systems

Reflectivity

Microscopes

Back illuminated sensors

Light emitting diodes

Reflection

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