Monte Carlo simulator for x-ray spectra analysis of GaAs detectors

Adriano Cola; Lino Reggiani; Lorenzo Vasanelli

doi:10.1117/12.366604

19 October 1999 Monte Carlo simulator for x-ray spectra analysis of GaAs detectors

Adriano Cola, Lino Reggiani, Lorenzo Vasanelli

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366604
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We have developed a Monte Carlo simulator for semi- insulating GaAs detectors which gives the energy spectra of x-ray radiations. The simulated spectra are analyzed in terms of: shaping time, trapping properties of the material, and applied reverse voltage. The main features of the spectra as well as the associated charge collection efficiency and the energy resolution of the photoelectric peak are interpreted in physical terms for the whole range of applied voltages covering under- and over-depleted conditions. The results of the simulations provide a general interpretation scheme which is satisfactorily tested with experimental results.

Citation Download Citation

Adriano Cola, Lino Reggiani, and Lorenzo Vasanelli "Monte Carlo simulator for x-ray spectra analysis of GaAs detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366604

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