Paper
6 October 1999 Polycrystalline mercuric iodide detectors
Michael M. Schieber, Haim Hermon, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Evgenie Meerson, Yehezkel Saado
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Abstract
The fabrication of polycrystalline HgI2 thick film detectors using the hot wall physical vapor deposition, method is described. The X-ray response of these detectors to a radiological X-ray generator of 60 kVp has been studied using the current integration mode. The response expressed in (mu) A, the dark current expressed in pA/cm2 and sensitivity expressed in (mu) C/R(DOT)cm2 are given for these detectors for several thickness and grain sizes. The optimal sensitivity is compared with published data on the response to X-rays by polycrystalline PbI2 and A-Se detectors.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Schieber, Haim Hermon, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Evgenie Meerson, and Yehezkel Saado "Polycrystalline mercuric iodide detectors", Proc. SPIE 3770, Medical Applications of Penetrating Radiation, (6 October 1999); https://doi.org/10.1117/12.368177
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KEYWORDS
X-rays

Sensors

X-ray detectors

Crystals

Electrodes

Surface plasmons

Electrons

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