Paper
9 November 1999 Phase modulation of polariton in a GaAs quantum well waveguide
Kazuhiko Hosomi, Masataka Shirai, Toshio Katsuyama
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Abstract
In order to clarify the temperature dependence of the polariton phase change under electric field, an interferometric measurement was performed. The sample was a 400-micrometers -long polariton waveguide made of GaAs/AlGaAs layers with a p-i-n structure. A 7.5 nm GaAs single-quantum well is formed at the center of the core layer. The measured phase change at a lower temperature is about 10 times larger than that at a higher temperature, and the critical temperature is around 120 K. This critical temperature is remarkably high although the damping of the polariton usually occurs at a relatively low temperature. Such a high critical temperature indicates a possibility of a polariton device operation in a relatively high-temperature region.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazuhiko Hosomi, Masataka Shirai, and Toshio Katsuyama "Phase modulation of polariton in a GaAs quantum well waveguide", Proc. SPIE 3899, Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures, (9 November 1999); https://doi.org/10.1117/12.369391
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Cited by 1 scholarly publication.
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KEYWORDS
Polaritons

Temperature metrology

Waveguides

Quantum wells

Excitons

Gallium arsenide

Phase shifts

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