Polarimetric characterization of Federal Standard paints

Dennis H. Goldstein

doi:10.1117/12.406618

15 November 2000 Polarimetric characterization of Federal Standard paints

Dennis H. Goldstein

Proceedings Volume 4133, Polarization Analysis, Measurement, and Remote Sensing III; (2000) https://doi.org/10.1117/12.406618
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A limited polarimetric characterization of paint samples on aluminum substrates is presented. Twelve painted aluminum panels, representing various colors, reflectances, and surface finishes, were examined in a spectropolarimetric reflectometer. Data were analyzed in detail for the 0.9 to 1.0 micrometer wavelength region, although data were taken over a wider spectral range. Polarizance was measured for the twelve samples at eight input beam incidence angles. All observations were made from normal to the sample. Characterization of the surface roughness of the samples was done using profilometers. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the sample decreases, the polarizance increases.

Citation Download Citation

Dennis H. Goldstein "Polarimetric characterization of Federal Standard paints", Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); https://doi.org/10.1117/12.406618

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