Paper
18 December 2000 Measurement of coincidence timing resolution with CdTe detectors
Yiping Shao, H. Bradford Barber, Stephen J. Balzer, Simon R. Cherry
Author Affiliations +
Abstract
The coincidence timing resolution is a critical performance parameter to determine if direct gamma-ray detection by semiconductor detector material such as CdTe or CdZnTe may be suitable for use in positron emission tomography systems. We report experimental results of the coincidence timing resolution measured with a pair of 2 by 2 by 10 mm3 CdTe detectors irradiated by 511 keV gamma rays under conditions that allow good timing resolution and good energy resolution to be obtained simultaneously. The measured coincidence time resolutions ranged from 14 ns to 24 ns. We also found that the coincidence timing resolution was proportional to the signal rise time, and that both of these were proportional to the electron transit time.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yiping Shao, H. Bradford Barber, Stephen J. Balzer, and Simon R. Cherry "Measurement of coincidence timing resolution with CdTe detectors", Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); https://doi.org/10.1117/12.410570
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Sensors

Signal detection

Gamma radiation

Positron emission tomography

Amplifiers

Electronics

Temperature metrology

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