Paper
18 December 2000 Mercuric iodide thick films for radiological x-ray detectors
Michael M. Schieber, Haim Hermon, Robert A. Street, Steve E. Ready, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Michael Lukach, Evgenie Meerson, Yehezkel Saado, Eithan Pinkhasy
Author Affiliations +
Abstract
For the first time polycrystalline HgI2 photoconductor material directly evaporated on a-Si array for direct conversion of x-rays for imaging purposes, were successfully imaged at Xerox-Palo Alto Research Center. The initial results are very promising and show a high x-ray sensitivity and low leakage current. Since Ti-W alloys are used as pixel electrodes, an intermediate passivation layer must be used to prevent a chemical reaction with the detector plate. The thickness that these Polycrystalline HgI2 thick film detectors have been fabricated until now is up to 1,800 micrometers , which makes them useful also for high energy applications. The characterization of the Polycrystalline HgI2 thick films deposited with or without the passivation layers by measuring their dark currents, sensitivity to 65 and 85 kVp x-rays and residual signals after 1 minute of biasing, will be shown for several detectors. Some preliminary results will be shown for some novel screen-printed HgI2 detectors.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael M. Schieber, Haim Hermon, Robert A. Street, Steve E. Ready, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, Rubil Shatunovsky, Michael Lukach, Evgenie Meerson, Yehezkel Saado, and Eithan Pinkhasy "Mercuric iodide thick films for radiological x-ray detectors", Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); https://doi.org/10.1117/12.410563
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Cited by 22 scholarly publications.
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KEYWORDS
Sensors

X-rays

X-ray detectors

Electrodes

Surface plasmons

Dielectric polarization

X-ray imaging

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