Studies of phase retardation plates with universal null polarimeter

Oleg S. Kushnir; O. S. Dzendzelyuk; V. A. Grabovski; V. B. Mikhailik

doi:10.1117/12.388436

14 June 2000 Studies of phase retardation plates with universal null polarimeter

Oleg S. Kushnir, O. S. Dzendzelyuk, V. A. Grabovski, V. B. Mikhailik

Proceedings Volume 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing; (2000) https://doi.org/10.1117/12.388436
Event: International Workshop on Optoelectronic and Hybrid Optical/Digital Systems for Image/Signal Processing, 1999, Lviv, Ukraine

Abstract

The high-accuracy polarimetric technique for testing the retardation and the other parameters of phase retardation plates is described. It is based on the so-called universal null-polarimeter for crystal optical studies and represents an improved version of the method developed earlier by the authors. The influence of optical activity, dichroism and multiple reflection effects on the final data is analyzed. The experimental results on several commercial retardation plates made from quartz and lithium niobate are reported.

Citation Download Citation

Oleg S. Kushnir, O. S. Dzendzelyuk, V. A. Grabovski, and V. B. Mikhailik "Studies of phase retardation plates with universal null polarimeter", Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); https://doi.org/10.1117/12.388436

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