Paper
10 October 2000 Roundness measurement using angle probes
Wei Gao, Eijiro Sato, Satoshi Kiyono
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403856
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
To measure roundness errors of cylindrical workpieces and spindle errors of machine tools in on-machine conditions, it is important to separate the roundness error and spindle error from each other. Basically there are two kinds of error separation methods. One is known as the multi-orientation method, and the other is the multi-probe method. Multi-orientations including the step method and the reversal method can separate the spindle error and the roundness error effectively, if the spindle error has good repeatability. Compared with multi-orientation methods, multi-probe methods are more suitable for on-machine measurements, because the repeatability of the spindle error is not necessary. In this paper, we present a new error-separation method using multiple angle probes. In the angular three-probe method, three angle probes are fixed around the workpiece to detect roundness profile and two-dimensional spindle error components simultaneously. The effect of the spindle is canceled in the differential output of the probes and the correct roundness profile can be evaluated from the differential data. In this paper, the principle of the angular three-probe method is described. Experimental results of comparing with the conventional displacement three-probe method are also presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Gao, Eijiro Sato, and Satoshi Kiyono "Roundness measurement using angle probes", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403856
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Cited by 4 scholarly publications.
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KEYWORDS
Spindles

Error analysis

Sensors

Fourier transforms

Spatial frequencies

Collimation

Inspection

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