Paper
8 May 2001 Nonlinear filtering and pattern recognition: Are they the same?
Edward R. Dougherty, Junior Barrera
Author Affiliations +
Proceedings Volume 4304, Nonlinear Image Processing and Pattern Analysis XII; (2001) https://doi.org/10.1117/12.424961
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
Statistical design of window-based nonlinear filters for signal and image processing is closely related to pattern recognition. The theory of pattern recognition is concerned with estimating the errors of optimal classifiers and with designing classifiers from sample data whose errors are close to minimal. Of special importance is the Vapnik- Chervonenkis theory, which relates the design cost to the VC dimension of a classification rule. This paper discusses both constraint and design costs for the design of nonlinear filters, and discusses the relation to the theory of pattern recognition. As to the question posed in the title, the paper argues that nonlinear filtering possesses its own integrity because classification rules and constraints depend on signal and image properties, both in theory and the manner in which expert knowledge is applied in design.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edward R. Dougherty and Junior Barrera "Nonlinear filtering and pattern recognition: Are they the same?", Proc. SPIE 4304, Nonlinear Image Processing and Pattern Analysis XII, (8 May 2001); https://doi.org/10.1117/12.424961
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KEYWORDS
Filtering (signal processing)

Nonlinear filtering

Error analysis

Pattern recognition

Signal processing

Electronic filtering

Image filtering

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